Détails relatifs à l'auteur

Rechem, Djamil, Laboratory of materials and structure of electromechanical systems and their reliability,Department of electrical engineering, Faculty of Sciences and Applied Sciences, University Larbi Ben     M’hidi Oum El Bouaghi, 4000, Algeria.<br />

  • - Semiconductor Materials
    Modeling of Surrounding Gate MOSFETs with Interface trapped charges
    Résumé


 

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