In this work, we studied the morphology of thin chromium layer by simulation and experimentally. We deposited the metallic layer, by means of thermal evaporation, on a glass substrate. We used the atomic force microscopy (AFM) method to analyze the topographical properties. By this imaging technique, we obtained several qualitative and quantitative results. For instance, we have computed the roughness and the Root Mean Square (RMS) of the films with a good accuracy. On the other hand, we obtained the topography, in two and three dimensions with a high resolution. The chromium layer was porous which was in agreement with the simulation result. We obtained very good geometrical forms that were not in agreement with literature. The disagreement was probably due to the surface state of the glass substrate.