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The effect of substrate on the magnetic and structural properties of series of cobalt thin films deposited onto Si (100), Corning glass and GaAs were investigated. The samples were prepared using physical vapor deposition under vacuum. The thickness of the magnetic layer ranges from 19 to 250 nm, The static magnetic properties are studied using Physical Property Measurement System (P.P.M.S.) tools. The XRD spectra reveal a polycrystalline structure for all the films whatever is the substrate nature. The hysteresis loops infer that the easy axis of the magnetization lies in the films plane, the highest spontaneous magnetization (fig.1) being 1240 emu/cm3, measured for Co (74 nm)/Si(100) thin film. We will discuss all these results.