In this work, copper(II) oxide (CuO) thin films are synthesized on glass substrates using different number of coatings (2,5,10 and 15) by sol-gel dip-coating technique. The effects of thickness and annealing temperature on structural morphological, optical and electrical properties are investigated using X-rays diffraction (XRD) ,atomic force microscopy (AFM) ,UV-Vis-NIR spectroscopy and I-V measurements . To prepare the solution, Anhydrous Copper(II)-chloride, ethanol and triton X were used as precursor , solvent and stabilizer agent respectively. The results showed that all films are well crystallized in CuO monoclinic structure. AFM images showed that the morphology of films is affected by the thickness and temperature annealing. UV-Vis-NIR optical spectra revealed that optical transmittance decreases with increasing film's thickness. The (I-V) measurement of the realized ITO / CuO-p / SnO2-n junction provided short-circuit current density of 0.05 (A) and open circuit voltage of 0.005 (V).