Various structural and magnetic characterization techniques have been used to investigate FePd thin films onto different substrates. Series of Fe_xPd_1-x (x = 18, 24, 26, 27 and 34 at. %) thin film were deposited onto Si(111) by thermal evaporation technique. X-ray diffraction (XRD), atomic force microscopy (AFM) experiments were performed to study the structure and the surface morphology of these films. The evaporated layers crystallized in the face centered cubic structures for different composition of palladium. The images issued from AFM present flat surface for most of the films. The atomic compositions of these films obtained by Energy dispersive analysis showed that the films are rich in Fe. The magnetic properties were obtained by VSM, the magnetization curves display hysteresis loops allowing to infer that the magnetization axis lies in the plane of the film with a total absence of in-plane anisotropy. The samples of FePd ï¬lms with a Pd content with in 18–34at. % are ferromagnetic at room temperature. The magnetization of the ï¬lms depends on the Pd content and decreases linearly with increasing Pd concentration; however, the coercivity does not exhibit any monotonic dependence. The different physical parameters were investigated as a function of composition of palladium.

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