Last modified: 2018-08-14
Abstract
ABSTRACT
In this study, ZnO/NiO heterostructure thin films were prepared by sol-gel dip-coating method. first, NiO thin films were deposited onto clean glass substrates, NiO precursor solution and preparation method was mentioned in[1]. Second, ZnO thin films were deposited on the prepared NiO thin films and the obtained ZnO/NiO thin films were annealed at 550 oC for 2h. The structural, optical and morphological properties of the ZnO/NiO thin films were investigated using: X-ray diffraction (XRD), UV-Vis spectrophotometer and atomic force microscopy.
The most important results come from the XRD spectrum; it can be clearly to observe the peaks of NiO and ZnO with dominant (002) peak belonging to ZnO. Also a good optical transmittance of the films within the visible and near infrared region was found to be more than 75%.
References
[1] N. Abdelouahab, G. Rebai, F. Hichem, and Z. Mourad, "Effect of Withdrawal Speed on the Structural , Optical and Morphological Properties of NiO Thin Films Obtained by Sol-Gel Dip Coating Method," vol. 31, pp. 2935, 2017.