Papers are invited on all topics related to metrology and industrial control, including:
T1. Standardization and quality evaluation
T2. Optical Metrology
T3. Nanotechnology measurements
T4. Acoustic and electronic metrology
T5. Recent measurement techniques in: mechanics, physics, chemistry, pharmacy, health, food industry, environment and energy
T6. Monitoring, diagnosis and prognosis techniques
T7. Industrial maintenance management